3-Dimensional atomic scale structure of the ionic liquid-graphite interface elucidated by AM-AFM and quantum chemical simulations.
- Page, Alister J., Elbourne, Aaron, Stefanovic, Ryan, Addicoat, Matthew A., Warr, Gregory G., Voïtchovsky, Kislon, Atkin, Rob
A 12-electrode piezoelectric tube scanner for fast atomic force microscopy
- Yong, Yuen K., Ahmed, Bilal, Moheimani, S. O. R.
A 2-DOF electrostatically actuated MEMS nanopositioner for on-chip AFM
- Fowler, A. G., Laskovski, A. N., Hammond, A. C., Moheimani, S. O. R.
A 2DOF SOI-MEMS nanopositioner with tilted flexure bulk piezoresistive displacement sensors
- Maroufi, Mohammad, Moheimani, S. O. Reza
A compact XYZ scanner for fast atomic force microscopy in constant force contact mode
- Yong, Yuen Kuan, Moheimani, S. O. Reza
A high-bandwidth amplitude estimation technique for dynamic mode atomic force microscopy
- Karvinen, K. S., Moheimani, S. O. R.
A new scanning method for fast atomic force microscopy
- Mahmood, Iskandar A., Moheimani, S. O. Reza, Bhikkaji, Bharath
A novel self-sensing technique for tapping-mode atomic force microscopy
- Ruppert, Michael G., Moheimani, S. O. Reza
A review of demodulation techniques for amplitude-modulation atomic force microscopy
- Ruppert, Michael G., Harcombe, David M., Ragazzon, Michael R. P., Moheimani, S. O. Reza, Fleming, Andrew J.
A review of scanning methods and control implications for scanning probe microscopy
- Teo, Yik R., Yong, Yuen K., Fleming, Andrew J.
A review of techniques for attaching micro- and nanoparticles to a probe's tip for surface force and near-field optical measurements (Invited review article)
A serial-kinematic nanopositioner for high-speed atomic force microscopy
- Wadikhaye, Sachin P., Yong, Yuen Kuan, Reza Moheimani, S. O.
A survey of control issues in nanopositioning
- Devasia, Santosh, Eleftheriou, Evangelos, Moheimani, S. O. Reza
A switched gain resonant controller to minimize image artifacts in intermittent contact mode atomic force microscopy
- Fairbairn, Matthew W., Moheimani, S. O. Reza
Active atomic force microscope cantilevers with integrated device layer piezoresistive sensors
- Ruppert, Michael G., Fleming, Andrew J., Yong, Yuen K.
Active piezoelectric shunt control of an atomic force microscope micro-cantilever
- Fairbairn, Matthew W., Mueller, Philipp, Moheimani, S. O. Reza
Adaptive scan for atomic force microscopy based on online optimization: theory and experiment
- Wang, Kaixiang, Ruppert, Michael G., Manzie, Chris, Nesic, Dragan, Yong, Yuen Kuan
Adsorption of 12-s-12 gemini surfactants at the silica-aqueous solution interface
- Atkin, R., Craig, V. S. J., Wanless, E. J., Biggs, S.
AFM and STM studies on the surface interaction of (BMP)TFSA and (EMIm)TFSA ionic liquids with Au(111)
- Atkin, Rob, El Abedin, Sherif Zein, Hayes, Robert, Gasparotto, Luiz H. S., Borisenko, Natalia, Endres, Frank
AFM cantilever design for multimode Q control: arbitrary placement of higher order modes
- Moore, Steven Ian, Ruppert, Michael G., Yong, Yuen Kuan
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