Your selections:
A closed-loop phase-locked interferometer for wide bandwidth position sensing
- Fleming, Andrew J., Routley, Ben S.
A high-bandwidth amplitude estimation technique for dynamic mode atomic force microscopy
- Karvinen, K. S., Moheimani, S. O. R.
A highly contrasting scanning helium microscope
- Fahy, A., Barr, M., Martens, J., Dastoor, P. C.
A megahertz bandwidth dual amplifier for driving piezoelectric actuators and other highly capacitive loads
A novel self-sensing technique for tapping-mode atomic force microscopy
- Ruppert, Michael G., Moheimani, S. O. Reza
A review of techniques for attaching micro- and nanoparticles to a probe's tip for surface force and near-field optical measurements (Invited review article)
A serial-kinematic nanopositioner for high-speed atomic force microscopy
- Wadikhaye, Sachin P., Yong, Yuen Kuan, Reza Moheimani, S. O.
A simple counter-flow cooling system for a supersonic free-jet beam source assembly
- Barr, M., Fahy, A., Martens, J., Dastoor, P. C.
Atomic force microscopy with a 12-electrode piezoelectric tube scanner
- Yong, Yuen K., Ahmed, Bilal, Moheimani, S. O. Reza
Compact ultra-fast vertical nanopositioner for improving scanning probe microscope scan speed
- Kenton, Brian J., Fleming, Andrew J., Leang, Kam K.
Diagonal control design for atomic force microscope piezoelectric tube nanopositioners
- Bhikkaji, B., Yong, Y. K., Mahmood, I. A., Moheimani, S. O. R.
- Tremsin, A. S., Sokolova, A. V., Salvemini, F., Luzin, V., Paradowska, A., Muransky, O., Kirkwood, H. J., Abbey, B., Wensrich, C. M., Kisi, E. H.
Existing methods for improving the accuracy of digital-to-analog converters
- Eielsen, Arnfinn A., Fleming, Andrew J.
High speed single- and dual-stage vertical positioners
- Yong, Yuen K., Wadikhaye, Sachin P., Fleming, Andrew J.
High-speed Lissajous-scan atomic force microscopy: scan pattern planning and control design issues
- Bazaei , A., Yong , Yuen K., Moheimani , S. O. Reza
High-stroke silicon-on-insulator MEMS nanopositioner: control design for non-raster scan atomic force microscopy
- Maroufi, Mohammad, Fowler, Anthony G., Bazaei, Ali, Moheimani, S. O. Reza
Invited review article: accurate and fast nanopositioning with piezoelectric tube scanners: emerging trends and future challenges
Invited review article: high-speed flexure-guided nanopositioning: mechanical design and control issues
- Yong, Y. K., Moheimani, S. O. R., Kenton, B. J., Leang, K. K.
Making a commercial atomic force microscope more accurate and faster using positive position feedback control
- Mahmood, I. A., Moheimani, S. O. Reza
Neutron diffraction strain tomography: demonstration and proof-of-concept
- Gregg, A. W. T., Hendriks, J. N., Wensrich, C. M., Luzin, V., Wills, A.
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