Invited review article: high-speed flexure-guided nanopositioning: mechanical design and control issues

- Yong, Y. K., Moheimani, S. O. R., Kenton, B. J., Leang, K. K.

High speed single- and dual-stage vertical positioners

- Yong, Yuen K., Wadikhaye, Sachin P., Fleming, Andrew J.

Diagonal control design for atomic force microscope piezoelectric tube nanopositioners

- Bhikkaji, B., Yong, Y. K., Mahmood, I. A., Moheimani, S. O. R.

Sensorless enhancement of an atomic force microscope micro-cantilever quality factor using piezoelectric shunt control

- Fairbairn, M., Moheimani, S. O. R.

Neutron diffraction strain tomography: demonstration and proof-of-concept

- Gregg, A. W. T., Hendriks, J. N., Wensrich, C. M., Luzin, V., Wills, A.

A simple counter-flow cooling system for a supersonic free-jet beam source assembly

- Barr, M., Fahy, A., Martens, J., Dastoor, P. C.

A high-bandwidth amplitude estimation technique for dynamic mode atomic force microscopy

- Karvinen, K. S., Moheimani, S. O. R.

Note: An improved low-frequency correction technique for piezoelectric force sensors in high-speed nanopositioning systems

- Yong, Yuen K., Fleming, Andrew J.

Note: Guaranteed collocated multimode control of an atomic force microscope cantilever using on-chip piezoelectric actuation and sensing

- Ruppert, Michael G., Yong, Yuen K.

High-stroke silicon-on-insulator MEMS nanopositioner: control design for non-raster scan atomic force microscopy

- Maroufi, Mohammad, Fowler, Anthony G., Bazaei, Ali, Moheimani, S. O. Reza

Recovering the spectrum of a low level signal from two noisy measurements using the cross power spectral density

- Fleming, Andrew J., Ninness, Brett, Wills, Adrian

Note: A method for estimating the resolution of nanopositioning systems

- Fleming, Andrew J.

A highly contrasting scanning helium microscope

- Fahy, A., Barr, M., Martens, J., Dastoor, P. C.

A closed-loop phase-locked interferometer for wide bandwidth position sensing

- Fleming, Andrew J., Routley, Ben S.

Resonant control of an atomic force microscope micro-cantilever for active Q control

- Fairbairn, M., Moheimani, S. O. R.

A serial-kinematic nanopositioner for high-speed atomic force microscopy

- Wadikhaye, Sachin P., Yong, Yuen Kuan, Reza Moheimani, S. O.

A novel self-sensing technique for tapping-mode atomic force microscopy

- Ruppert, Michael G., Moheimani, S. O. Reza

High-speed Lissajous-scan atomic force microscopy: scan pattern planning and control design issues

- Bazaei , A., Yong , Yuen K., Moheimani , S. O. Reza

Signal transformation approach to fast nanopositioning

- Sebastian, Abu, Moheimani, S. O. Reza

A review of techniques for attaching micro- and nanoparticles to a probe's tip for surface force and near-field optical measurements (Invited review article)

- Gan, Yang