Your selections:
A closed-loop phase-locked interferometer for wide bandwidth position sensing
- Fleming, Andrew J., Routley, Ben, Holdsworth, John L.
A closed-loop phase-locked interferometer for wide bandwidth position sensing
- Fleming, Andrew J., Routley, Ben S.
A comparison of scanning methods and the vertical control implications for scanning probe microscopy
- Teo, Yik R., Yong, Yuen, Fleming, Andrew J.
A grounded-load charge amplifier for reducing hysteresis in piezoelectric tube scanners
- Fleming, Andrew J., Moheimani, S. O. Reza
A megahertz bandwidth dual amplifier for driving piezoelectric actuators and other highly capacitive loads
A method for reducing piezoelectric non-linearity in scanning probe microscope images
A new electrical configuration for improving the range of piezoelectric bimorph benders
- Rios, Shannon A., Fleming, Andrew J.
A new method for robust damping and tracking control of scanning probe microscope positioning stages
- Fleming, Andrew J., Aphale, Sumeet S., Moheimani, S. O. Reza
A new repetitive control scheme based on non-causal FIR filters
- Teo, Yik R., Fleming, Andrew J.
A new robust damping and tracking controller for SPM positioning stages
- Fleming, Andrew J., Aphale, Sumeet S., Moheimani, S. O. Reza
A nonlinear programming approach to exposure optimization in scanning laser lithography
- Fleming, Andrew J., Wills, Adrian, Ghalehbeygi, Omid T., Routley, Ben, Ninness, Brett
- Islam, Mohd Noor, Fleming, Andrew J.
A novel electrical configuration for three wire piezoelectric bimorph micro-positioners
- Rios, Shannon A., Fleming, Andrew J.
- Yong, Yuen Kuan, Fleming, Andrew J., Moheimani, S. O. Reza
A review of demodulation techniques for amplitude-modulation atomic force microscopy
- Ruppert, Michael G., Harcombe, David M., Ragazzon, Michael R. P., Moheimani, S. O. Reza, Fleming, Andrew J.
A review of demodulation techniques for multifrequency atomic force microscopy
- Harcombe, David M., Ruppert, Michael G., Fleming, Andrew J.
A review of nanometer resolution position sensors: operation and performance
A review of scanning methods and control implications for scanning probe microscopy
- Teo, Yik R., Yong, Yuen K., Fleming, Andrew J.
- Teo, Yik R., Fleming, Andrew J., Eielsen, Arnfinn A., Tommy Gravdahl, J.
Active damping control using optimal Integral Force Feedback
- Teo, Yik R., Fleming, Andrew J.
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