Your selections:
High performance raster scanning of atomic force microscopy using Model-free Repetitive Control
- Li, Linlin, Fleming, Andrew J., Yong, Yuen K., Aphale, Sumeet S., Zhu, LiMin
Improving robustness filter bandwidth in repetitive control by considering model mismatch
- Eielsen, Arnfinn A., Teo, Yik R., Fleming, Andrew J.
- Teo, Yik R., Fleming, Andrew J., Eielsen, Arnfinn A., Tommy Gravdahl, J.
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