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physical instrumentation control

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2No 1Yes

2atomic force microscopy 2control system synthesis 2feedback 1bending 1cantilevers 1damping 1elastic constants 1finite element analysis 1micromechanical devices 1nanopositioning 1piezoelectric actuators 1position control 1reduced order systems 1scanning probe microscopy 1vibration isolation

1Allgower, Frank 1Fairbairn, Matthew W. 1Fleming, Andrew J. 1Maess, Johannes 1Moheimani, S. O. R. 1Moheimani, S. O. Reza 1Ruppert, Michael G. 1Wadikhaye, S. P. 1Yong, Y. K.

Date

22013 12008

1Adobe Acrobat PDF

Facets

Full Text

2No 1Yes

2atomic force microscopy 2control system synthesis 2feedback 1bending 1cantilevers 1damping 1elastic constants 1finite element analysis 1micromechanical devices 1nanopositioning 1piezoelectric actuators 1position control 1reduced order systems 1scanning probe microscopy 1vibration isolation

1Allgower, Frank 1Fairbairn, Matthew W. 1Fleming, Andrew J. 1Maess, Johannes 1Moheimani, S. O. R. 1Moheimani, S. O. Reza 1Ruppert, Michael G. 1Wadikhaye, S. P. 1Yong, Y. K.

Date

22013 12008

1Adobe Acrobat PDF

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Multi-mode resonant control of a microcantilever for atomic force microscopy

- Ruppert, Michael G., Fairbairn, Matthew W., Moheimani, S. O. Reza

Creator: Ruppert, Michael G. , Fairbairn, Matthew W. , Moheimani, S. O. Reza
Resource Type: conference paper
Date: 2013

Multi-mode resonant control of a microcantilever for atomic force microscopy

Creator: Ruppert, Michael G. , Fairbairn, Matthew W. , Moheimani, S. O. Reza
Resource Type: conference paper
Date: 2013

Nanopositioner design using tapered flexures: a parametric study

- Wadikhaye, S. P., Yong, Y. K., Moheimani, S. O. R.

Creator: Wadikhaye, S. P. , Yong, Y. K. , Moheimani, S. O. R.
Resource Type: conference paper
Date: 2013

Model-based vibration suppression in piezoelectric tube scanners through induced voltage feedback

- Maess, Johannes, Fleming, Andrew J., Allgower, Frank

Creator: Maess, Johannes , Fleming, Andrew J. , Allgower, Frank
Resource Type: conference paper
Date: 2008

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