Your selections:
- Veryovkin, Igor V., Calaway, Wallis F., Moore, Jerry F., Pellin, Michael J., Lewllen, John W., Li, Yuelin, Milton, Stephen V., King, Bruce V., Petravic, Mladen
Estimation of useful yield in surface analysis using single photon ionisation
- King, B. V., Pellin, M. J., Moore, J. F., Veryovkin, I. V., Savina, M. R., Tripa, C. E.
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