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Your selections:
Dual actuation for high speed atomic force microscopy
- Kuiper, S., Fleming, A. J., Schitter, G.
High performance nanopositioning with integrated strain and force feedback
- Fleming, Andrew J., Leang, Kam K.
Tracking control of a novel AFM scanner using signal transformation method
- Bazaei, Ali, Yong, Yuen K., Moheimani, S. O. Reza, Sebastian, Abu
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