Quantitative, nanoscale mapping of sp² percentage and crystal orientation in carbon multilayers
Bosman, M., Keast, V. J., Watanabe, M., McCulloch, D. G., Shakerzadeh, M., Teo, E. H. T., Tay, B. K.
The electronic structure of tungsten oxide thin films prepared by pulsed cathodic arc deposition and plasma-assisted pulsed magnetron sputtering
Field, M. R., McCulloch, D. G., Lim, S. N. H., Anders, A., Keast, V. J., Burgess, R. W.
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