A high-bandwidth amplitude estimation technique for dynamic mode atomic force microscopy
Karvinen, K. S., Moheimani, S. O. R.
Analysis and application of modulated-demodulated control
Control of the higher eigenmodes of a microcantilever: applications in atomic force microscopy
Modulated-demodulated control: Q control of an AFM microcantilever
Modulated-demodulated Q control of an atomic force microscope microcantilever
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