- Title
- Influence of temperature and molecular structure on ionic liquid solvation layers
- Creator
- Wakeham, Deborah; Hayes, Robert; Warr, Gregory G.; Atkin, Rob
- Relation
- Journal of Physical Chemistry B Vol. 113, Issue 17, p. 5961-5966
- Publisher Link
- http://dx.doi.org/10.1021/jp900815q
- Publisher
- American Chemical Society
- Resource Type
- journal article
- Date
- 2009
- Description
- Atomic force microscopy (AFM) force profiling is used to investigate the structure of adsorbed and solvation layers formed on a mica surface by various room temperature ionic liquids (ILs) ethylammonium nitrate (EAN), ethanolammonium nitrate (EtAN), ethylammonium formate (EAF), propylammonium formate (PAF), ethylmethylammonium formate (EMAF), and dimethylethylammonium formate (DMEAF). At least seven layers are observed for EAN at 14 °C (melting point 13 °C), decreasing as the temperature is increased to 30 °C due to thermal energy disrupting solvophobic forces that lead to segregation of cation alkyl tails from the charged ammonium and nitrate moieties. The number and properties of the solvation layers can also be controlled by introducing an alcohol moiety to the cation’s alkyl tail (EtAN), or by replacing the nitrate anion with formate (EAF and PAF), even leading to the detection of distinct cation and anion sublayers. Substitution of primary by secondary or tertiary ammonium cations reduces the number of solvation layers formed, and also weakens the cation layer adsorbed onto mica. The observed solvation and adsorbed layer structures are discussed in terms of the intermolecular cohesive forces within the ILs.
- Subject
- atomic force microscopy; solvation layers; ammonium cations; ionic liquids
- Identifier
- http://hdl.handle.net/1959.13/806556
- Identifier
- uon:7136
- Identifier
- ISSN:1520-6106
- Rights
- This document is the Accepted Manuscript version of a Published Work that appeared in final form in the Journal of Physical Chemistry B, copyright © American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see http://dx.doi.org/10.1021/jp900815q
- Language
- eng
- Full Text
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