Measuring scattering distributions in scanning helium microscopy

Title: Measuring scattering distributions in scanning helium microscopy
Creator: Hatchwell, C. J.; Bergin, M.; Carr, B.; Barr, M. G.; Fahy, A.; Dastoor, P. C.
Relation: Ultramicroscopy Vol. 260, Issue June 2024, no. 113951
Publisher Link: http://dx.doi.org/10.1016/j.ultramic.2024.113951
Publisher: Elsevier
Resource Type: journal article
Date: 2024
Description: A scanning helium microscope typically utilises a thermal energy helium atom beam, with an energy and wavelength (¡100meV, ∼0.05 nm) particularly sensitive to surface structure. An angular detector stage for a scanning helium microscope is presented that facilitates the in-situ measurement of scattering distributions from a sample. We begin by demonstrating typical elastic and inelastic scattering from ordered surfaces. We then go on to show the role of topography in diffuse scattering from disordered surfaces, observing deviations from simple cosine scattering. In total, these studies demonstrate the wealth of information that is encoded into the scattering distributions obtained with the technique.
Subject: scanning helium microscopy; atom scattering; scattering distribution; helium
Identifier: http://hdl.handle.net/1959.13/1501218
Identifier: uon:55106
Identifier: ISSN:0304-3991
Rights: x
Language: eng
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