Impact of random and periodic surface roughness on P- and L-band radiometry

- Shen, Xiaoji; Walker, Jeffrey P.; Jackson, Thomas; Ye, Nan; Wu, Xiaoling; Brakhasi, Foad; Boopathi, Nithyapriya; Zhu, Liujun; Yeo, In-Young; Kim, Edward; Kerr, Yann