- Title
- Non-collocated displacement sensing by semiconductor strain gauges in differentially piezo-driven nanopositioners
- Creator
- Bazaei, Ali; Boudaoud, Mokrane; Ettefagh, Massoud Hemmasian; Chen, Zhiyong; Regnier, Stephane
- Relation
- IEEE Sensors Journal Vol. 21, Issue 8, p. 9690-9697
- Publisher Link
- http://dx.doi.org/10.1109/JSEN.2020.3009222
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Resource Type
- journal article
- Date
- 2021
- Description
- We address design, implementation, and characterization of semiconductor strain gauges as stage displacement sensors with small footprint for piezo-driven nanopositioners in differential actuation mode. The strain gauges are not collocated with the stage of the nanopositioner. They are attached to piezo stack actuators in both longitudinal and transverse directions. We address two differential configurations for the displacement sensing. The first configuration uses all strain gauges and provides three output signals. Two of them are proportional to the length variations of the piezo actuators, which are considered as conventional non-differential sensing method. The last output in the first configuration is the first proposed differential sensor. In the second configuration, we propose an alternative differential sensor using only the longitudinal strain gauges and a simpler readout circuit. The results indicate that in the differential actuation mode, a differential sensing strategy provides much better accuracy than the conventional non-differential schemes. Using a laser interferometer as an independent collocated sensor for stage displacement, we obtained constant calibration factors both proposed differential sensors and characterized their sensing accuracies.
- Subject
- displacement sensor; semiconductor strain gauge; piezoresistive sensor; nanopositioner; plezoelectric actuator; differential actuation
- Identifier
- http://hdl.handle.net/1959.13/1434560
- Identifier
- uon:39457
- Identifier
- ISSN:1530-437X
- Language
- eng
- Reviewed
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