- Title
- A review of demodulation techniques for multifrequency atomic force microscopy
- Creator
- Harcombe, David M.; Ruppert, Michael G.; Fleming, Andrew J.
- Relation
- Beilstein Journal of Nanotechnology Vol. 11, p. 76-91
- Publisher Link
- http://dx.doi.org/10.3762/bjnano.11.8
- Publisher
- Beilstein - Institut zur Foerderung der Chemischen Wissenschaften
- Resource Type
- journal article
- Date
- 2020
- Description
- This article compares the performance of traditional and recently proposed demodulators for multifrequency atomic force microscopy. The compared methods include the lock-in amplifier, coherent demodulator, Kalman filter, Lyapunov filter, and direct-design demodulator. Each method is implemented on a field-programmable gate array (FPGA) with a sampling rate of 1.5 MHz. The metrics for comparison include the sensitivity to other frequency components and the magnitude of demodulation artifacts for a range of demodulator bandwidths. Performance differences are demonstrated through higher harmonic atomic force microscopy imaging.
- Subject
- atomic force microscopy (AFM); multifrequency; demodulation; Kalman filter; Lyapunov filter; digital signal processing; field-programmable gate array (FPGA)
- Identifier
- http://hdl.handle.net/1959.13/1426028
- Identifier
- uon:38352
- Identifier
- ISSN:2190-4286
- Rights
- This is an Open Access article under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/4.0). Please note that the reuse, redistribution and reproduction in particular requires that the authors and source are credited.
- Language
- eng
- Full Text
- Reviewed
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