- Title
- Bifurcations and EXIT charts for the binary erasure channel
- Creator
- Kellett, Christopher M.; Weller, Steven R.
- Relation
- 2006 IEEE International Symposium on Information Theory. Proceedings of the 2006 IEEE International Symposium on Information Theory (Seattle, WA July, 2006) p. 2559-2563
- Publisher Link
- http://dx.doi.org/10.1109/ISIT.2006.262094
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Resource Type
- conference paper
- Date
- 2006
- Description
- In this paper we present an abstraction of the extrinsic information transfer (EXIT) chart as the interconnection of two nonlinear systems in feedback with each other. We present results on the stability of fixed points for such a dynamical system and use this framework to rederive the well-known stability condition, connecting this to the one-dimensional dynamical system describing the fractions of erasure for low-density parity-check (LDPC) codes on the binary erasure channel (BEC). We observe that the error threshold corresponds to a fixed point bifurcation for this one-dimensional system, and show that this information can be visualized using a well-known tool from control theory: the root locus plot. We further show that these bifurcations can be seen by examining the EXIT chart.
- Subject
- bifurcation; EXIT chart; LDPC codes; nonlinear systems; root locus plot
- Identifier
- http://hdl.handle.net/1959.13/30720
- Identifier
- uon:2698
- Identifier
- ISBN:1424405041
- Rights
- Copyright © 2006 IEEE. Reprinted from IEEE International Symposium on Information Theory, 2006, p. 2559-2563. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of the University of Newcastle's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
- Language
- eng
- Full Text
- Reviewed
- Hits: 1535
- Visitors: 1886
- Downloads: 414
| Thumbnail | File | Description | Size | Format | |||
|---|---|---|---|---|---|---|---|
| View Details Download | ATTACHMENT01 | Publisher version (open access) | 633 KB | Adobe Acrobat PDF | View Details Download |