- Title
- Quality factor enhancement of an atomic force microscope micro-cantilever using piezoelectric shunt control
- Creator
- Fairbairn, Matthew W.; Moheimani, S.O. Reza
- Relation
- 2012 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM) . Proceedings of the 2012 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM) (Kaohsiung, Taiwan 11-14 July, 2012) p. 556-561
- Publisher Link
- http://dx.doi.org/10.1109/AIM.2012.6265890
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Resource Type
- conference paper
- Date
- 2012
- Description
- The quality (Q) factor of the Atomic Force Microscope (AFM) micro-cantilever influences both the maximum scan speed and image quality when operating in tapping mode. Increasing the Q factor of the micro-cantilever results in an increase in force sensitivity and a reduction in tapping force. Active piezoelectric shunt control uses an active electrical impedance to modify the mechanical dynamics of the cantilever. An increase in the effective Q factor of a piezoelectric AFM micro-cantilever by over 25 times has been demonstrated using this technique.
- Identifier
- http://hdl.handle.net/1959.13/1313163
- Identifier
- uon:22531
- Identifier
- ISBN:9781467325752
- Language
- eng
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