A knife-edge measurement of the beam profile of STXM 5.3.2.2 using a focussed ion beam milled metallic glass

Title: A knife-edge measurement of the beam profile of STXM 5.3.2.2 using a focussed ion beam milled metallic glass
Creator: Burke, Kerry B.; Luber, Erik J.; Holmes, Natalie P.; Murray, Andrew J.; Belcher, Warwick J.; Zhou, Xiaojing; Mitlin, David; Dastoor, Paul C.
Relation: Journal of Electron Spectroscopy and Related Phenomena Vol. 185, Issue 11, p. 453-457
Publisher Link: http://dx.doi.org/10.1016/j.elspec.2012.07.003
Publisher: Elsevier
Resource Type: journal article
Date: 2012
Description: We present a simple knife-edge measurement of the STXM 5.3.2.2 synchrotron X-ray beam width. The knife edge was constructed by ion beam milling a metallic glass alloy consisting of 60% gold, 20% nickel and 20% hafnium and was determined to be well-defined to within 2 nm by TEM. An asymmetric beam profile of 120 nm FWHM in the vertical direction and 150 nm FWHM in the horizontal direction was determined and was observed to depart from the expected Airy function profile.
Subject: scanning transmission X-ray microscopy; (STXM) resolution; focussed ion beam (FIB) milling; metallic glass
Identifier: http://hdl.handle.net/1959.13/1311505
Identifier: uon:22221
Identifier: ISSN:0368-2048
Language: eng
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