Minimizing probe loss in tapping mode atomic force microscopy using a switched gain resonant controller

Title: Minimizing probe loss in tapping mode atomic force microscopy using a switched gain resonant controller
Creator: Fairbairn, Matthew W.; Moheimani, S. O. Reza
Relation: 2nd Australian Control Conference (AUCC 2012). Proceedings of the 2012 Australian Control Conference (Sydney, Australia 15-16 November, 2012) p. 7-12
Relation: https://controls.papercept.net/conferences/conferences/AUCC12/program/AUCC12_ContentListWeb_1.html#thit2_03
Publisher: Engineers Australia
Resource Type: conference paper
Date: 2012
Description: When imaging samples containing large steep drops in topography at high speed, with an Atomic Force Microscope (AFM) operating in tapping mode, it is common for the sensing cantilever probe to lose contact with the sample. This leads to significant artifacts in the resulting image. In this work a switched gain resonant controller is developed to increase the effective quality (Q) factor of the AFM microcantilever when the tip loses contact with the sample. This technique is shown to considerably reduce the time that the probe is detached from the sample resulting in reduced image artifacts. This method of Q factor switching is designed to be compact and easily integrable into existing AFMs.
Subject: Atomic Force Microscope; cantilever displacement; optical lever method; Q factor
Identifier: http://hdl.handle.net/1959.13/1309414
Identifier: uon:21863
Identifier: ISBN:9781922107633
Language: eng
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