- Title
- Active piezoelectric shunt control of an atomic force microscope micro-cantilever
- Creator
- Fairbairn, Matthew W.; Mueller, Philipp; Moheimani, S. O. Reza
- Relation
- 3rd Australian Control Conference (AUCC). Proceedings of the 3rd Australian Control Conference (AUCC) (Perth, Australia 04-05 November, 2013) p. 257-262
- Publisher Link
- http://dx.doi.org/10.1109/AUCC.2013.6697282
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Resource Type
- conference paper
- Date
- 2013
- Description
- The benefits of decreasing the quality (Q) factor of an Atomic Force Microscope (AFM) micro-cantilever, when operating in tapping mode, using passive piezoelectric shunt control have been previously demonstrated. A passive electrical impedance is placed in series with the cantilever oscillation voltage to control the Q factor of the cantilever. The amount of Q factor reduction obtainable using this method is limited due to the passive nature of the shunt impedance. This work demonstrates that further decreases in the cantilever Q factor may be obtained through the use of an active impedance. The active impedance is designed in such a way that the piezoelectric shunt controller emulates a PPF controller in a displacement feedback loop. The damping obtained with this controller is compared with the maximum damping obtainable with a passive impedance.
- Subject
- Q-factor; atomic force microscopy; cantilevers; control system synthesis
- Identifier
- http://hdl.handle.net/1959.13/1065305
- Identifier
- uon:17817
- Identifier
- ISBN:9781479924974
- Language
- eng
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