A highly contrasting scanning helium microscope

Title: A highly contrasting scanning helium microscope
Creator: Fahy, A.; Barr, M.; Martens, J.; Dastoor, P. C.
Relation: Review of Scientific Instruments Vol. 86, Issue 2
Publisher Link: http://dx.doi.org/10.1063/1.4907539
Publisher: American Institute of Physics
Resource Type: journal article
Date: 2015
Description: We present a scanning helium microscope equipped to make use of the unique contrast mechanisms, surface sensitivity, and zero damage imaging the technique affords. The new design delivers an order of magnitude increase in the available helium signal, yielding a higher contrast and signal-to-noise ratio. These improvements allow the microscope to produce high quality, intuitive images of samples using topological contrast, while setting the stage for investigations into further contrast mechanisms. © American Institute of Physics
Subject: image sensors; particle beam detectors; electron microscopes; high pressure; atom scattering
Identifier: http://hdl.handle.net/1959.13/1061690
Identifier: uon:16997
Identifier: ISSN:0034-6748
Language: eng
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