Improving the scan rate and image quality in tapping mode Atomic Force Microscopy with piezoelectric shunt control

Title: Improving the scan rate and image quality in tapping mode Atomic Force Microscopy with piezoelectric shunt control
Creator: Fairbairn, Matthew W.; Moheimani, S. O. Reza; Fleming, Andrew J.
Relation: 1st Australian Control Conference, 2011 (AUCC 2011). Proceedings of the 1st Australian Control Conference 2011 (Melbourne 10-11 November, 2011) p. 26-31
Relation: http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6114331
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Resource Type: conference paper
Date: 2011
Description: The scan rate of tapping mode Atomic Force Microscopy (AFM), when scanning in air, may be improved by reducing the quality (Q) factor of the micro-cantilever. Passive piezoelectric shunt control is implemented in the AFM by placing an electrical impedance in series with the cantilever tip oscillation circuit. This method is used to reduce the Q factor of a piezoelectric self actuating AFM micro-cantilever by a factor of 8. Experimental results demonstrate that scan rate and image quality may be improved significantly using this method.
Subject: quality control; Atomic Force Microscopy; image quality; nanocantilevers; piezoelectricity
Identifier: http://hdl.handle.net/1959.13/1038529
Identifier: uon:13553
Identifier: ISBN:9781424492459
Language: eng
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