- Title
- Development of an improved field ionization detector incorporating a secondary electron stage
- Creator
- Fahy, A.; O'Donnell, K. M.; Barr, M.; Zhou, X. J.; Allison, W.; Dastoor, P. C.
- Relation
- Measurement Science and Technology Vol. 22, Issue 11
- Publisher Link
- http://dx.doi.org/10.1088/0957-0233/22/11/115902
- Publisher
- Institute of Physics (IOP) Publishing
- Resource Type
- journal article
- Date
- 2011
- Description
- Field ionization from sharp tips is attracting increased attention for use in detectors for neutral atomic/molecular species. However, the direct detection of the ionized species typically results in low sensitivities due to the small acceptance angle of the receiving ion-sensitive measurement device (usually a channel electron multiplier) and can result in sputtering damage due to the relatively high mass and energy of the incident ion species. Here we present a design for a field-ionization-based neutral atom detector incorporating a simple secondary electron generating stage. The use of such a stage decouples the field-ionized species from the detected electron signal, thus eliminating any sputtering damage to the channel electron multiplier. The detector armature discussed is shown to exhibit a linear response to neutral gas pressure and a sensitivity that is improved by more than two orders of magnitude over a previous field ionization detector design.
- Subject
- field ionization; helium atom microscopy; neutral atom detection
- Identifier
- http://hdl.handle.net/1959.13/936636
- Identifier
- uon:12367
- Identifier
- ISSN:0957-0233
- Language
- eng
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