- Title
- Compact ultra-fast vertical nanopositioner for improving scanning probe microscope scan speed
- Creator
- Kenton, Brian J.; Fleming, Andrew J.; Leang, Kam K.
- Relation
- Review of Scientific Instruments Vol. 82, Issue 12
- Publisher Link
- http://dx.doi.org/10.1063/1.3664613
- Publisher
- American Institute of Physics
- Resource Type
- journal article
- Date
- 2011
- Description
- The mechanical design of a high-bandwidth, short-range vertical positioning stage is described for integration with a commercial scanning probe microscope (SPM) for dual-stage actuation to significantly improve scanning performance. The vertical motion of the sample platform is driven by a stiff and compact piezo-stack actuator and guided by a novel circular flexure to minimize undesirable mechanical resonances that can limit the performance of the vertical feedback control loop. Finite element analysis is performed to study the key issues that affect performance. To relax the need for properly securing the stage to a working surface, such as a laboratory workbench, an inertial cancellation scheme is utilized. The measured dominant unloaded mechanical resonance of a prototype stage is above 150 kHz and the travel range is approximately 1.56 μm. The high-bandwidth stage is experimentally evaluated with a basic commercial SPM, and results show over 25-times improvement in the scanning performance.
- Subject
- atomic force microscopy; finite element analysis; piezoelectric actuators; scanning probe microscopy
- Identifier
- http://hdl.handle.net/1959.13/936262
- Identifier
- uon:12257
- Identifier
- ISSN:0034-6748
- Rights
- © American Institute of Physics
- Language
- eng
- Full Text
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