- Title
- A 12-electrode piezoelectric tube scanner for fast atomic force microscopy
- Creator
- Yong, Yuen K.; Ahmed, Bilal; Moheimani, S. O. R.
- Relation
- 2010 American Control Conference (ACC 2010). Proceedings of the 2010 American Control Conference (Baltimore, MD 30 June - 2 July, 2010) p. 4957-4962
- Relation
- http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5530941
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Resource Type
- conference paper
- Date
- 2010
- Description
- This paper presents a 12-electrode piezoelectric tube scanner for fast atomic force microscopy (AFM). The scanner is used simultaneously as a sensor and an actuator. The built-in sensing mechanism of the scanner allows for displacement measurement and the unique arrangement of the electrodes allows the tube to be driven in an anti-symmetrical manner, resulting in a collocated system suitable for positive-position feedback (PPF). A PPF controller is designed to damp the scanner's resonance. The device is installed into an AFM to obtain open- and closed-loop images of a grating at 10Hz, 15.6Hz and 31Hz scan rates. The closed-loop images are noticeably superior to the open-loop images, showcasing the effectiveness of the proposed scanner.
- Subject
- atomic force microscopy; displacement measurements; piezoelectric tube scanners; piezoelectricity; scanning
- Identifier
- http://hdl.handle.net/1959.13/933907
- Identifier
- uon:11744
- Identifier
- ISBN:978142444264
- Identifier
- ISSN:0743-1619
- Rights
- Copyright © 2010 IEEE. Reprinted from the Proceedings of the American Control Conference, 2010. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of the University of Newcastle's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
- Language
- eng
- Full Text
- Reviewed
- Hits: 1473
- Visitors: 2661
- Downloads: 669
| Thumbnail | File | Description | Size | Format | |||
|---|---|---|---|---|---|---|---|
| View Details Download | ATTACHMENT01 | Publisher version (open access) | 1 MB | Adobe Acrobat PDF | View Details Download |