Organic bonding to silicon via a carbonyl group: new insights from atomic-scale images

- Schofield, Steven R., Saraireh, Sherin A., Smith, Phillip V., Radny, Marian W., King, Bruce V.

Single hydrogen atoms on the Si(001) surface

- Radny, M. W., Smith, P. V., Reusch, T. C. G, Warschkow, O., Marks, N. A., Wilson, H. F., Schofield, S. R., Curson, N. J., McKenzie, D. R., Simmons, M. Y.

Single P and As dopants in the Si(001) surface

- Radny, M. W., Smith, P. V., Reusch, T. C. G., Warschkow, O., Marks, N. A., Shi, H. Q., McKenzie, D. R., Schofield, S. R., Curson, N. J., Simmons, M. Y.

Towards hybrid silicon-organic molecular electronics: the stability of acetone on the Si(0 0 1) surface

- Saraireh, S. A., Schofield, S. R., Smith, P. V., Radny, M. W., King, B. V.

Binding sites for SiH₂/Si(0 0 1): a combined ab initio, tight-binding, and classical investigation

- Cereda, S., Montalenti, F., Cogoni, M., Branduardi, D., Radny, M. W., Smith, P. V., Miglio, Leo

Phosphine adsorption and dissociation on the Si(001) surface: an ab initio survey of structures

- Warschkow, O., Wilson, H. F., Marks, N. A., Schofield, S. R., Curson, N. J., Smith, P. V., Radny, M. W., McKenzie, D. R., Simmons, M. Y.

Phosphine adsorption and dissociation on the Si(001) surface: an ab initio survey of structures

- Warschkow, O., Wilson, H. F., Marks, N. A., Schofield, S. R., Curson, N. J., Smith, P. V., Radny, M. W., McKenzie, D. R., Simmons, M. Y.

Scanning probe microscopy for silicon device fabrication

- Simmons, M. Y., Ruess, F. J., Reusch, T. C. G., Goh, K. E. J., Hallam, T., Schofield, S. R., Oberbeck, L., Curson, N. J., Hamilton, A. R., Butcher, M. J., Clark, R. G.

Atomic and electronic structure of the Si(001)2 x 1-K surface

- Shi, H. Q., Radny, M. W., Smith, P. V.

Boron segregation on the Si(111)√3 x √3R30° surface

- Shi, Hongqing, Radny, M. W., Smith, P. V.

Evaluation of different models for the dissociation of silane on the Si(111)7 x 7 surface using the extended Brenner empirical potential

- Que, J.-Z., Radny, M. W., Smith, P. V.

Measurements of Si ion stopping in amorphous silicon

- Whitlow, Harry J., Timmers, Heiko, Elliman, Robert G., Weijers, Tessica D. M., Zhand, Yanwen, Uribastera, Juan, O'Connor, D. John